Research Article
A pattern growth-based sequential pattern mining algorithm called prefixSuffixSpan
@ARTICLE{10.4108/eai.18-1-2017.152103, author={Kenmogne Edith Belise and Tadmon Calvin and Nkambou Roger}, title={A pattern growth-based sequential pattern mining algorithm called prefixSuffixSpan}, journal={EAI Endorsed Transactions on Scalable Information Systems}, volume={4}, number={12}, publisher={EAI}, journal_a={SIS}, year={2017}, month={1}, keywords={sequence mining, sequential pattern, pattern-growth direction, pattern-growth ordering, search space, pruning, partitioning.}, doi={10.4108/eai.18-1-2017.152103} }
- Kenmogne Edith Belise
Tadmon Calvin
Nkambou Roger
Year: 2017
A pattern growth-based sequential pattern mining algorithm called prefixSuffixSpan
SIS
EAI
DOI: 10.4108/eai.18-1-2017.152103
Abstract
Sequential pattern mining is an important data mining problem widely addressed by the data mining community, with a very large field of applications. The sequence pattern mining aims at extracting a set of attributes, shared across time among a large number of objects in a given database. The work presented in this paper is directed towards the general theoretical foundations of the pattern-growth approach. It helps indepth understanding of the pattern-growth approach, current status of provided solutions, and direction of research in this area. In this paper, this study is carried out on a particular class of pattern-growth algorithms for which patterns are grown by making grow either the current pattern prefix or the current pattern suffix from the same position at each growth-step. This study leads to a new algorithm called prefixSuffixSpan. Its correctness is proven and experimentations are performed.
Copyright © 2017 K. E. Belise et al., licensed to EAI. This is an open access article distributed under the terms of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/), which permits unlimited use, distribution and reproduction in any medium so long as the original work is properly cited.