1st International ICST Workshop on New Computational Methods for Inverse Problems

Research Article

Imaging and detection of cracks in metallic structures with Eddy current sensors

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BibTeX Plain Text
  • @INPROCEEDINGS{10.4108/icst.valuetools.2011.245817,
    author={Dominique  Placko  and Thierry  Bore  and Pierre - Yves  Joubert },
    title={Imaging and detection of cracks in metallic structures with Eddy current sensors},
    proceedings={1st International ICST Workshop on New Computational Methods for Inverse Problems},
    publisher={ACM},
    proceedings_a={NCMIP},
    year={2012},
    month={6},
    keywords={eddy currents dpsm modeling multi-frequency imaging},
    doi={10.4108/icst.valuetools.2011.245817}
}
  • Dominique Placko
    Thierry Bore
    Pierre - Yves Joubert
    Year: 2012
    Imaging and detection of cracks in metallic structures with Eddy current sensors
    NCMIP
    ICST
    DOI: 10.4108/icst.valuetools.2011.245817
Dominique Placko 1,*, Thierry Bore 2, Pierre - Yves Joubert 3
  • 1: SATIE, ENS Cachan, CNRS, 61 avenue du président Wilson 94 235 Cachan Cedex +33 (0) 1 47 40 55 81
  • 2: Université Paris Est, IFSTTAR 58, boulevard Lefebvre 75732 Paris Cedex 15 Present address : Andra 1-7, rue Jean-Monnet - 92298 Châtenay-Malabry cedex
  • 3: SATIE, ENS Cachan, CNRS, 61 avenue du président Wilson 94 235 Cachan Cedex +33 (0) 1 47 40 55 90
*Contact email: dominique.placko@satie.enscachan. fr

Abstract

In this paper we will focus on the modeling of electromagnetic (EM) systems, in the aim of using it in an inversion scheme. The purpose will consists in imaging cracks with eddy current sensors, through an estimation of the conductivity of the piece of metal under test. There are plenty of industrial applications in Non Destructive Evaluations for monitoring of cracks in structures used in Aeronautics, Metallurgy, ships building and so on. For modeling, a relatively new developed technique, called ‘Distributed Points Source Method’ (DPSM) has been used.

Keywords
eddy currents dpsm modeling multi-frequency imaging
Published
2012-06-26
Publisher
ACM
http://dx.doi.org/10.4108/icst.valuetools.2011.245817
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