Threshold Analysis for Full Area Coverage in Three Dimensions Based on Bin-Covering Technique

Huafeng Liu; Qiong Li

9th International Conference on Communications and Networking in China

Research Article

Threshold Analysis for Full Area Coverage in Three Dimensions Based on Bin-Covering Technique

Cite: BibTeX Plain Text

@INPROCEEDINGS{10.4108/icst.chinacom.2014.256335,
    author={Huafeng Liu and Qiong Li},
    title={Threshold Analysis for Full Area Coverage in Three Dimensions Based on Bin-Covering Technique},
    proceedings={9th International Conference on Communications and Networking in China},
    publisher={IEEE},
    proceedings_a={CHINACOM},
    year={2015},
    month={1},
    keywords={threshold analysis 3d full area coverage bin-covering},
    doi={10.4108/icst.chinacom.2014.256335}
}

Huafeng Liu
Qiong Li
Year: 2015
Threshold Analysis for Full Area Coverage in Three Dimensions Based on Bin-Covering Technique
CHINACOM
IEEE
DOI: 10.4108/icst.chinacom.2014.256335

Huafeng Liu¹^,*, Qiong Li²

1: Beijing Space Information Relay Transmission Technology Research Center
2: Beijing Institute of Tracking and Telecommunications Technology

*Contact email: liu_hua_feng@sina.cn

Abstract

Three-dimensional (3D) wireless sensor networks (WSNs) have recently received attention due to their wide-range potential applications. Although some studies have been done on 3D WSNs design, the phase transition phenomena in 3D WSNs has not been adequately analyzed. In this paper, we focus on extending a threshold analysis for full area coverage in WSNs from two-dimensional to three-dimensional case using an analysis technique called bin-covering. We also conduct additional experiments to demonstrate the accuracy of our analysis. Our results can be helpful in understanding threshold properties of full area coverage in 3D WSNs.

Keywords: threshold analysis 3d full area coverage bin-covering

Published: 2015-01-21
Publisher: IEEE
Appears in: IEEEXplore

: http://dx.doi.org/10.4108/icst.chinacom.2014.256335