Research Article
Measurement Strategies for Evaluation of Freeform Surfaces using Coordinate Measuring Machine: A Comprehensive Review
@INPROCEEDINGS{10.4108/eai.23-2-2024.2346952, author={Rajamani R and Bharatwaj V M and Dharanieshwar C and Hariharan R and Prithiviraj S}, title={Measurement Strategies for Evaluation of Freeform Surfaces using Coordinate Measuring Machine: A Comprehensive Review}, proceedings={Proceedings of the International Conference on Advancements in Materials, Design and Manufacturing for Sustainable Development, ICAMDMS 2024, 23-24 February 2024, Coimbatore, Tamil Nadu, India}, publisher={EAI}, proceedings_a={ICAMDMS}, year={2024}, month={6}, keywords={genetic algorithm particle swarm optimization algorithms ant colony optimization probe path planning sampling points free-form surfaces coordinate measuring machines}, doi={10.4108/eai.23-2-2024.2346952} }- Rajamani R
Bharatwaj V M
Dharanieshwar C
Hariharan R
Prithiviraj S
Year: 2024
Measurement Strategies for Evaluation of Freeform Surfaces using Coordinate Measuring Machine: A Comprehensive Review
ICAMDMS
EAI
DOI: 10.4108/eai.23-2-2024.2346952
Abstract
This paper reviews the different methodologies used to optimize the probe path for measuring the free-form profiles using Coordinate Measuring Machines (CMM). A CMM is mostly used in manufacturing industries for inspecting the part with simple and complex geometries. The parts with simple geometries can be effectively measured using CMM, however, the optimization techniques are used to select the sampling points during measurement of freeform profiles. The study explores the utilization of computing techniques such as Genetic Algorithms (GA), Ant Colony Optimization (ACO) algorithms, Particle Swarm Optimization (PSO) algorithms and B-spline curves for optimizing the sampling points while measuring the freeform profiles. The literature review also discusses the use of optimization techniques for dimensional control and inspection planning. This study provides valuable insights into the optimization of probe path and sampling points in CMM measurements, contributing to the advancement of dimensional control and inspection planning for parts with free-form profiles.
