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Proceedings of the 4th International Conference on Image, Algorithms, and Artificial Intelligence, ICIAAI 2026, 22-24 May 2026, Singapore, Singapore

Research Article

Industrial Defect Detection Based on Computer Vision

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  • @INPROCEEDINGS{10.4108/eai.22-5-2026.2365356,
        author={Yiyuan  Chen},
        title={ Industrial Defect Detection Based on Computer Vision},
        proceedings={Proceedings of the 4th International Conference on Image, Algorithms, and Artificial Intelligence, ICIAAI 2026, 22-24 May 2026, Singapore, Singapore},
        publisher={EAI},
        proceedings_a={ICIAAI},
        year={2026},
        month={8},
        keywords={Computer Vision Industrial Defect Detection Deep Learning Machine Vision},
        doi={10.4108/eai.22-5-2026.2365356}
    }
    
  • Yiyuan Chen
    Year: 2026
    Industrial Defect Detection Based on Computer Vision
    ICIAAI
    EAI
    DOI: 10.4108/eai.22-5-2026.2365356
Yiyuan Chen1,*
  • 1: School of Artificial Intelligence Science and Technology, University of Shanghai for Science and Technology, Shanghai, China
*Contact email: 2435062011@st.usst.edu.cn

Abstract

To address the numerous limitations of traditional industrial defect detection, this paper reviews the current research condition of computer vision in the field of industrial defect detection. It summarizes the current technical bottlenecks and development trends. This study takes multiple typical industrial scenarios as the research objects, and conducts an analysis around technical principles and applications. It makes a detailed comparison between traditional and deep learning techniques, analyzes multi-industry applications, datasets, and evaluation systems, and distills the core challenges at both the technical and implementation levels, providing a reference for research and implementation in this field.

Keywords
Computer Vision, Industrial Defect Detection, Deep Learning, Machine Vision
Published
2026-08-31
Publisher
EAI
http://dx.doi.org/10.4108/eai.22-5-2026.2365356
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