
Research Article
Industrial Defect Detection Based on Computer Vision
@INPROCEEDINGS{10.4108/eai.22-5-2026.2365356, author={Yiyuan Chen}, title={ Industrial Defect Detection Based on Computer Vision}, proceedings={Proceedings of the 4th International Conference on Image, Algorithms, and Artificial Intelligence, ICIAAI 2026, 22-24 May 2026, Singapore, Singapore}, publisher={EAI}, proceedings_a={ICIAAI}, year={2026}, month={8}, keywords={Computer Vision Industrial Defect Detection Deep Learning Machine Vision}, doi={10.4108/eai.22-5-2026.2365356} }- Yiyuan Chen
Year: 2026
Industrial Defect Detection Based on Computer Vision
ICIAAI
EAI
DOI: 10.4108/eai.22-5-2026.2365356
Abstract
To address the numerous limitations of traditional industrial defect detection, this paper reviews the current research condition of computer vision in the field of industrial defect detection. It summarizes the current technical bottlenecks and development trends. This study takes multiple typical industrial scenarios as the research objects, and conducts an analysis around technical principles and applications. It makes a detailed comparison between traditional and deep learning techniques, analyzes multi-industry applications, datasets, and evaluation systems, and distills the core challenges at both the technical and implementation levels, providing a reference for research and implementation in this field.
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