Reliability Considerations in Mobile Devices

I. Voyiatzis; D. Kavvadias; H. Antonopoulou; S. Sinitos

3rd International ICST Conference on Mobile Multimedia Communications

Research Article

Reliability Considerations in Mobile Devices

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Cite: BibTeX Plain Text

@INPROCEEDINGS{10.4108/ICST.MOBIMEDIA2007.1890,
    author={I. Voyiatzis and D. Kavvadias and H. Antonopoulou and S. Sinitos},
    title={Reliability Considerations in Mobile Devices},
    proceedings={3rd International ICST Conference on Mobile Multimedia Communications},
    proceedings_a={MOBIMEDIA},
    year={2010},
    month={5},
    keywords={Low power testing Mobile device reliability.},
    doi={10.4108/ICST.MOBIMEDIA2007.1890}
}

I. Voyiatzis
D. Kavvadias
H. Antonopoulou
S. Sinitos
Year: 2010
Reliability Considerations in Mobile Devices
MOBIMEDIA
ICST
DOI: 10.4108/ICST.MOBIMEDIA2007.1890

I. Voyiatzis¹^,*, D. Kavvadias²^,*, H. Antonopoulou³^,*, S. Sinitos¹^,*

1: Department of Informatics, Technological Educational Institute of Athens, Greece.
2: Department of Mathematics, University of Patras, Greece.
3: TEI of Patras & Computer Engineering and Informatics Department, University of Patras, Greece.

*Contact email: voyageri@otenet.gr, kavadias@ceid.gr, antonopl@cti.gr, ssocratis@yahoo.com

Abstract

The problem of reliability in current chips has been the subject of numerous researchers. Mobile devices, commonly used in multimedia communications require low power during both normal operation and testing. In this paper a novel algorithm is presented for embedding test sets containing don't care values into sequences generated by binary counters. Therefore, both test time and power consumed during testing of the chips can be considerably reduced.

Keywords: Low power testing Mobile device reliability.

Published: 2010-05-16
Modified: 2011-09-19

: http://dx.doi.org/10.4108/ICST.MOBIMEDIA2007.1890