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3rd International ICST Symposium on Modeling and Optimization in Mobile, Ad Hoc, and Wireless Networks

Research Article

Analysis of a reputation system for mobile ad-hoc networks with liars

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/WIOPT.2005.13,
        author={J.  Mundinger and J.-Y.  Le Boudec},
        title={Analysis of a reputation system for mobile ad-hoc networks with liars},
        proceedings={3rd International ICST Symposium on Modeling and Optimization in Mobile, Ad Hoc, and Wireless Networks},
        publisher={IEEE},
        proceedings_a={WIOPT},
        year={2005},
        month={4},
        keywords={},
        doi={10.1109/WIOPT.2005.13}
    }
    
  • J. Mundinger
    J.-Y. Le Boudec
    Year: 2005
    Analysis of a reputation system for mobile ad-hoc networks with liars
    WIOPT
    IEEE
    DOI: 10.1109/WIOPT.2005.13
J. Mundinger1, J.-Y. Le Boudec1
  • 1: Stat. Lab., Cambridge Univ., UK

Abstract

Using decentralized reputation systems is a promising approach to ensuring cooperation and fairness in mobile ad-hoc networks. However, they are vulnerable to liars and robustness has not been analyzed in detail. With our work, we provide a first step to the analysis of a reputation system based on a deviation test. Nodes accept second hand information only if this does not differ too much from their reputation values. Whereas our earlier paper [J. Mundinger and J.-Y. Le Boudec, 2005] dealt with a simplified one-dimensional model, we now consider the original two-dimensional system. We show that the system exhibits a phase transition. In the subcritical regime, it is robust and lying has no effect. In the supercritical regime, lying does have an impact. We compute the critical values via a mean-field approach and use simulations to verify our results. Thus, we obtain conditions for the deviation test to make the reputation system robust and provide guidelines for a good choice of parameters.

Published
2005-04-25
Publisher
IEEE
http://dx.doi.org/10.1109/WIOPT.2005.13
Copyright © 2005–2025 IEEE
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