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2nd International ICST Workshop On Wireless Network Measurement

Research Article

On Nodal Encounter Patterns in Wireless LAN Traces

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/WIOPT.2006.1666492,
        author={Wei-Jen  Hsu and Ahmed  Helmy},
        title={On Nodal Encounter Patterns in Wireless LAN Traces},
        proceedings={2nd International ICST Workshop On Wireless Network Measurement},
        publisher={IEEE},
        proceedings_a={WINMEE},
        year={2006},
        month={8},
        keywords={},
        doi={10.1109/WIOPT.2006.1666492}
    }
    
  • Wei-Jen Hsu
    Ahmed Helmy
    Year: 2006
    On Nodal Encounter Patterns in Wireless LAN Traces
    WINMEE
    IEEE
    DOI: 10.1109/WIOPT.2006.1666492
Wei-Jen Hsu1,*, Ahmed Helmy1
  • 1: Department of Electrical Engineering, University of Southern California.
*Contact email: weijenhs@usc.edu

Abstract

In this work we study WLAN traces from five different sources and focus on investigation of encounter patterns between users. We find that typical wireless LAN users encounter with a small portion of the whole population (no more than 60% in all traces, and on average between 1.88% to 6.70%). Total encounters of MNs follow BiPareto distribution. These few encounters are sufficient to build a connected relationship network, which is a Small World graph. We further investigate the potential of node-to-node information diffusion, and find that the richness of encounter pattern provides a reliable platform on which information diffusion without infrastructure is feasible and robust.

Published
2006-08-07
Publisher
IEEE
http://dx.doi.org/10.1109/WIOPT.2006.1666492
Copyright © 2006–2025 IEEE
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