2nd International ICST Conference on Broadband Networks

Research Article

Efficiency and throughput analysis of delayed-acknowledgement in WPANs

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/ICBN.2005.1589657,
    author={Kuang-Hao Liu and Humphrey Rutagemwa and Xuemin (Sherman)  Shen and Jon W.  Mark and Pin-Han Ho},
    title={Efficiency and throughput analysis of delayed-acknowledgement in WPANs},
    proceedings={2nd International ICST Conference on Broadband Networks},
    publisher={IEEE},
    proceedings_a={BROADNETS},
    year={2006},
    month={2},
    keywords={},
    doi={10.1109/ICBN.2005.1589657}
}
  • Kuang-Hao Liu
    Humphrey Rutagemwa
    Xuemin (Sherman) Shen
    Jon W. Mark
    Pin-Han Ho
    Year: 2006
    Efficiency and throughput analysis of delayed-acknowledgement in WPANs
    BROADNETS
    IEEE
    DOI: 10.1109/ICBN.2005.1589657
Kuang-Hao Liu1,*, Humphrey Rutagemwa1,*, Xuemin (Sherman) Shen1,*, Jon W. Mark1,*, Pin-Han Ho1,*
  • 1: Centre for Wireless Communications, Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
*Contact email: k8liu@bbcr.uwaterloo.ca, humphrey@bbcr.uwaterloo.ca, xshen@bbcr.uwaterloo.ca, jwmark@bbcr.uwaterloo.ca, pinhan@bbcr.uwaterloo.ca

Abstract

An analytical model for studying the performance of the delayed acknowledgement (Dly-ACK) mechanism in IEEE 802.15.3 over a fading channel is developed. A three-state Markov channel model is used to approximate both correlated and uncorrelated error processes. Explicit mathematical expressions for the goodput and efficiency of Dly-ACK are derived. It is found that the Dly-ACK mechanism yields higher goodput in a burst error environment than in a random error environment. The goodput tends to increase as the size of the burst increases; however, the amount of increase depends on the underlying delay. Simulations results are given to validate the analytical results.

Published
2006-02-13
Publisher
IEEE
http://dx.doi.org/10.1109/ICBN.2005.1589657
Copyright © 2005–2025 IEEE
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