Research Article
Designing Reliable Digital Molecular Electronic Circuits
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@INPROCEEDINGS{10.1007/978-3-642-04850-0_17, author={Ci Lei and Dinesh Pamunuwa and Steven Bailey and Colin Lambert}, title={Designing Reliable Digital Molecular Electronic Circuits}, proceedings={Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings}, proceedings_a={NANO-NET}, year={2012}, month={5}, keywords={molecular electronics circuit simulation nanotechnology}, doi={10.1007/978-3-642-04850-0_17} }
- Ci Lei
Dinesh Pamunuwa
Steven Bailey
Colin Lambert
Year: 2012
Designing Reliable Digital Molecular Electronic Circuits
NANO-NET
Springer
DOI: 10.1007/978-3-642-04850-0_17
Abstract
Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.
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