Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings

Research Article

Designing Reliable Digital Molecular Electronic Circuits

Download
524 downloads
  • @INPROCEEDINGS{10.1007/978-3-642-04850-0_17,
        author={Ci Lei and Dinesh Pamunuwa and Steven Bailey and Colin Lambert},
        title={Designing Reliable Digital Molecular Electronic Circuits},
        proceedings={Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings},
        proceedings_a={NANO-NET},
        year={2012},
        month={5},
        keywords={molecular electronics circuit simulation nanotechnology},
        doi={10.1007/978-3-642-04850-0_17}
    }
    
  • Ci Lei
    Dinesh Pamunuwa
    Steven Bailey
    Colin Lambert
    Year: 2012
    Designing Reliable Digital Molecular Electronic Circuits
    NANO-NET
    Springer
    DOI: 10.1007/978-3-642-04850-0_17
Ci Lei1, Dinesh Pamunuwa1, Steven Bailey1, Colin Lambert1
  • 1: Lancaster University

Abstract

Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.