Research Article
Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors
456 downloads
@INPROCEEDINGS{10.1007/978-3-642-02427-6_6, author={Michael Leuchtenburg and Pritish Narayanan and Teng Wang and Csaba Moritz}, title={Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors}, proceedings={Nano-Net. Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers}, proceedings_a={NANO-NET}, year={2012}, month={5}, keywords={nanoscale processor process variation defect tolerance}, doi={10.1007/978-3-642-02427-6_6} }
- Michael Leuchtenburg
Pritish Narayanan
Teng Wang
Csaba Moritz
Year: 2012
Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors
NANO-NET
Springer
DOI: 10.1007/978-3-642-02427-6_6
Abstract
We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.
Copyright © 2008–2024 ICST