Nano-Net. Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers

Research Article

Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors

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  • @INPROCEEDINGS{10.1007/978-3-642-02427-6_6,
        author={Michael Leuchtenburg and Pritish Narayanan and Teng Wang and Csaba Moritz},
        title={Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors},
        proceedings={Nano-Net. Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers},
        proceedings_a={NANO-NET},
        year={2012},
        month={5},
        keywords={nanoscale processor process variation defect tolerance},
        doi={10.1007/978-3-642-02427-6_6}
    }
    
  • Michael Leuchtenburg
    Pritish Narayanan
    Teng Wang
    Csaba Moritz
    Year: 2012
    Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors
    NANO-NET
    Springer
    DOI: 10.1007/978-3-642-02427-6_6
Michael Leuchtenburg1,*, Pritish Narayanan1,*, Teng Wang1,*, Csaba Moritz1,*
  • 1: UMass Amherst
*Contact email: mleuchte@ecs.umass.edu, pnarayan@ecs.umass.edu, twang@ecs.umass.edu, andras@ecs.umass.edu

Abstract

We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.