Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors

Michael Leuchtenburg; Pritish Narayanan; Teng Wang; Csaba Moritz

Nano-Net. Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers

Research Article

Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors

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@INPROCEEDINGS{10.1007/978-3-642-02427-6_6,
    author={Michael Leuchtenburg and Pritish Narayanan and Teng Wang and Csaba Moritz},
    title={Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors},
    proceedings={Nano-Net. Third International ICST Conference, NanoNet 2008, Boston, MA, USA, September 14-16, 2008, Revised Selected Papers},
    proceedings_a={NANO-NET},
    year={2012},
    month={5},
    keywords={nanoscale processor process variation defect tolerance},
    doi={10.1007/978-3-642-02427-6_6}
}

Michael Leuchtenburg
Pritish Narayanan
Teng Wang
Csaba Moritz
Year: 2012
Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors
NANO-NET
Springer
DOI: 10.1007/978-3-642-02427-6_6

Michael Leuchtenburg¹^,*, Pritish Narayanan¹^,*, Teng Wang¹^,*, Csaba Moritz¹^,*

1: UMass Amherst

*Contact email: mleuchte@ecs.umass.edu, pnarayan@ecs.umass.edu, twang@ecs.umass.edu, andras@ecs.umass.edu

Abstract

We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.

Keywords: nanoscale processor process variation defect tolerance

Published: 2012-05-09

: http://dx.doi.org/10.1007/978-3-642-02427-6_6