About | Contact Us | Register | Login
ProceedingsSeriesJournalsSearchEAI
Artificial Intelligence for Communications and Networks. 4th EAI International Conference, AICON 2022, Hiroshima, Japan, November 30 - December 1, 2022, Proceedings

Research Article

Fault Diameter of Strong Product Graph of Two Paths

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1007/978-3-031-29126-5_2,
        author={Yuxiang Yue and Feng Li},
        title={Fault Diameter of Strong Product Graph of Two Paths},
        proceedings={Artificial Intelligence for Communications and Networks. 4th EAI International Conference, AICON 2022, Hiroshima, Japan, November 30 - December 1, 2022, Proceedings},
        proceedings_a={AICON},
        year={2023},
        month={3},
        keywords={Paths Strong product graph Vertex fault diameter Edge fault diameter},
        doi={10.1007/978-3-031-29126-5_2}
    }
    
  • Yuxiang Yue
    Feng Li
    Year: 2023
    Fault Diameter of Strong Product Graph of Two Paths
    AICON
    Springer
    DOI: 10.1007/978-3-031-29126-5_2
Yuxiang Yue1,*, Feng Li1
  • 1: College of Computer Science
*Contact email: yueyuxiang21@126.com

Abstract

Strong product is an efficient method to construct large networks from small networks. Fault diameter is an important parameter to measure the fault tolerance and effectiveness of interconnection networks. In this paper, we first determine the vertex fault diameter of the strong product graph of two paths by constructing the internally vertex-disjoint paths between any two vertices in the graph, then we determine the edge fault diameter of the strong product graph of two paths by constructing the edge-disjoint paths between any two vertices in the graph. In addition, we propose an improved mesh network, whose model composed of strong product graph of two paths and has many excellent characteristics.

Keywords
Paths Strong product graph Vertex fault diameter Edge fault diameter
Published
2023-03-26
Appears in
SpringerLink
http://dx.doi.org/10.1007/978-3-031-29126-5_2
Copyright © 2022–2025 ICST
EBSCOProQuestDBLPDOAJPortico
EAI Logo

About EAI

  • Who We Are
  • Leadership
  • Research Areas
  • Partners
  • Media Center

Community

  • Membership
  • Conference
  • Recognition
  • Sponsor Us

Publish with EAI

  • Publishing
  • Journals
  • Proceedings
  • Books
  • EUDL