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Green Energy and Networking. 7th EAI International Conference, GreeNets 2020, Harbin, China, June 27-28, 2020, Proceedings

Research Article

Design and Analysis of a New Logistic Chaotic Digital Generation Circuit

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  • @INPROCEEDINGS{10.1007/978-3-030-62483-5_8,
        author={Juan Wang and Liu Wenbin and Han Tongzhuang and Zhou Xin},
        title={Design and Analysis of a New Logistic Chaotic Digital Generation Circuit},
        proceedings={Green Energy and Networking. 7th EAI International Conference, GreeNets 2020, Harbin, China, June 27-28, 2020, Proceedings},
        proceedings_a={GREENETS},
        year={2020},
        month={11},
        keywords={New logistic chaos Digital circuit NIST test},
        doi={10.1007/978-3-030-62483-5_8}
    }
    
  • Juan Wang
    Liu Wenbin
    Han Tongzhuang
    Zhou Xin
    Year: 2020
    Design and Analysis of a New Logistic Chaotic Digital Generation Circuit
    GREENETS
    Springer
    DOI: 10.1007/978-3-030-62483-5_8
Juan Wang1,*, Liu Wenbin1, Han Tongzhuang1, Zhou Xin1
  • 1: Electronic and Information Engineering Institute, Heilongjiang University of Science and Technology
*Contact email: 76115347@qq.com

Abstract

Chaotic signals have the characteristics of noise-like, difficult to predict, and very sensitive to the initial state. They have broad application prospects in the fields of communication and cryptography. Aiming at the shortcomings of the traditional one-dimensional discrete logistic chaotic map, the full mapping space is small, and the complexity is not high. In this paper, a new type of logistic digital chaos generation circuit with better performance is modeled and simulated. By testing and analyzing the initial value sensitivity, autocorrelation and other characteristics of the generated sequence, the influence and rules of circuit parameter setting on the randomness of digital chaotic sequences are obtained, so as to provide the necessary theoretical basis for the application of digital chaotic sequences.

Keywords
New logistic chaos Digital circuit NIST test
Published
2020-11-03
Appears in
SpringerLink
http://dx.doi.org/10.1007/978-3-030-62483-5_8
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