
Research Article
Signal-Triggered Automatic Acquisition Method for Electrical Leakage Fault Data of Electrical Circuits
@INPROCEEDINGS{10.1007/978-3-030-36405-2_38, author={Ming-fei Qu and Dong-bao Ma}, title={Signal-Triggered Automatic Acquisition Method for Electrical Leakage Fault Data of Electrical Circuits}, proceedings={Advanced Hybrid Information Processing. Third EAI International Conference, ADHIP 2019, Nanjing, China, September 21--22, 2019, Proceedings, Part II}, proceedings_a={ADHIP PART 2}, year={2019}, month={11}, keywords={First signal triggering Second electrical wiring Third leakage failure Forth automatic data collection}, doi={10.1007/978-3-030-36405-2_38} }
- Ming-fei Qu
Dong-bao Ma
Year: 2019
Signal-Triggered Automatic Acquisition Method for Electrical Leakage Fault Data of Electrical Circuits
ADHIP PART 2
Springer
DOI: 10.1007/978-3-030-36405-2_38
Abstract
Conventional electrical circuit leakage fault data acquisition technology of leakage fault information collection, Failure to eliminate noise interference, resulting in failure to achieve real-time acquisition of circuit leakage fault data. There is a problem of low data accuracy and large noise interference, therefore put forward based on signal trigger electrical wiring leakage fault data automatic acquisition methods. Electrical wiring leakage fault detection based on signal trigger automatic acquisition mechanism, structures, acquisition model system, the acquisition model system hardware, electrical wiring to realize automatically leakage failure data acquisition model building; Automatically determine the leakage failure data acquisition software workflow, based on the leakage current fault detection algorithm and software anti-interference design, implementation is based on signal trigger automatic electric circuit leakage failure data collection. The experimental data show that the proposed automatic collection method is 35.24% more accurate than the traditional collection method, which is suitable for automatic collection of leakage fault data of different electrical circuits at different times.