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6th International ICST Conference on Communications and Networking in China

Research Article

Statistical Analysis Of Error Patterns in Block Ciphered Crypto-System

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/ChinaCom.2011.6158271,
        author={Qiuhua Yang and Jian Wang and Shuangqing Wei and Jian Yuan},
        title={Statistical Analysis Of Error Patterns in Block Ciphered Crypto-System},
        proceedings={6th International ICST Conference on Communications and Networking in China},
        publisher={IEEE},
        proceedings_a={CHINACOM},
        year={2012},
        month={3},
        keywords={block encryption error characteristics encrypted channel transition probability},
        doi={10.1109/ChinaCom.2011.6158271}
    }
    
  • Qiuhua Yang
    Jian Wang
    Shuangqing Wei
    Jian Yuan
    Year: 2012
    Statistical Analysis Of Error Patterns in Block Ciphered Crypto-System
    CHINACOM
    IEEE
    DOI: 10.1109/ChinaCom.2011.6158271
Qiuhua Yang1,*, Jian Wang1, Shuangqing Wei2, Jian Yuan1
  • 1: Electronic Engineering Department of Tsinghua University
  • 2: Louisiana State University, Batton Rouge, LA 70803, USA
*Contact email: yangqh08@gmail.com

Abstract

In the presence of channel errors, the error pattern in decrypted plaintexts in block-ciphered systems demonstrates certain burst features. In this paper, we provide a rigorous study of error properties of block-ciphered cryptosystems operating in either ECB or CFB mode. By analyzing the relationship between bits within and across adjacent output blocks, we obtain the resulting equivalent channel transitional probabilities for each case. Our statistical characterization of the underlying burst patterns is of great importance to designing powerful error correcting codes that can enhance a legitimate system’s throughput under channel distortions.

Keywords
block encryption error characteristics encrypted channel transition probability
Published
2012-03-27
Publisher
IEEE
http://dx.doi.org/10.1109/ChinaCom.2011.6158271
Copyright © 2011–2025 IEEE
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