2nd International IEEE/Create-Net Conference on Testbeds and Research Infrastructures for the Development of Networks and Communities

Research Article

Experience with DETER: a testbed for security research

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/TRIDNT.2006.1649172,
    author={Terry  Benzel and Robert  Braden and Dongho  Kim and Cliford  Neuman and Anthony  Joseph and Keith  Sklower and Ron  Ostrenga and Stephen  Schwab },
    title={Experience with DETER: a testbed for security research},
    proceedings={2nd International IEEE/Create-Net Conference on Testbeds and Research Infrastructures for the Development of Networks and Communities},
    publisher={IEEE},
    proceedings_a={TRIDENTCOM},
    year={2006},
    month={7},
    keywords={},
    doi={10.1109/TRIDNT.2006.1649172}
}
  • Terry Benzel
    Robert Braden
    Dongho Kim
    Cliford Neuman
    Anthony Joseph
    Keith Sklower
    Ron Ostrenga
    Stephen Schwab
    Year: 2006
    Experience with DETER: a testbed for security research
    TRIDENTCOM
    IEEE
    DOI: 10.1109/TRIDNT.2006.1649172
Terry Benzel1, Robert Braden1, Dongho Kim1, Cliford Neuman1, Anthony Joseph2, Keith Sklower2, Ron Ostrenga3, Stephen Schwab 3
  • 1: Information Sciences Institute, University of Southern California
  • 2: Department of Computer Science, University of California, Berkeley
  • 3: SPARTA, Inc., Information Systems Security

Abstract

The DETER testbed is shared infrastructure designed for medium-scale repeatable experiments in computer security, especially those experiments that involve malicious code. The testbed provides unique resources and a focus of activity for an open community of academic, industry, and government researchers working toward better defenses against malicious attacks on our networking infrastructure, especially critical infrastructure. This paper presents our experience with the deployment and operation of the testbed, highlights some of the research conducted on the testbed, and discusses our plans for continued development, expansion, and replication of the testbed facility.

Published
2006-07-05
Publisher
IEEE
http://dx.doi.org/10.1109/TRIDNT.2006.1649172
Copyright © 2006–2025 IEEE
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