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1st International ICST Conference on Quality of Service in Heterogeneous Wired/Wireless Networks

Research Article

Real-time comparison of quality of interfaces (QoI) by mobile devices over heterogeneous radio networks

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/QSHINE.2004.46,
        author={ E.  van den Berg and S. Madhani and Tao   Zhang},
        title={Real-time comparison of quality of interfaces (QoI) by mobile devices over heterogeneous radio networks},
        proceedings={1st International ICST Conference on Quality of Service in Heterogeneous Wired/Wireless Networks},
        publisher={IEEE},
        proceedings_a={QSHINE},
        year={2004},
        month={12},
        keywords={},
        doi={10.1109/QSHINE.2004.46}
    }
    
  • E. van den Berg
    S. Madhani
    Tao Zhang
    Year: 2004
    Real-time comparison of quality of interfaces (QoI) by mobile devices over heterogeneous radio networks
    QSHINE
    IEEE
    DOI: 10.1109/QSHINE.2004.46
E. van den Berg1, S. Madhani1, Tao Zhang1
  • 1: Telcordia Technol. Inc., Piscataway, NJ, USA

Abstract

Emerging mobile devices are equipped with multiple interfaces allowing users to take advantage of heterogeneous radio technologies (e.g., cellular networks and wireless LANs). To support mobility and quality of service (QoS) for such multi-interface mobile devices, it is important to dynamically determine which interface or interfaces a mobile should use and when to switch from one interface to another. To make such decisions, it is critical for the mobile to compare the "qualities of the interfaces (QoI)", which may be measured by a variety of metrics, in real time so that the mobile can switch from one interface to another without user perceivable interruptions to on-going applications. This paper presents and analyzes new techniques for a mobile device to make rapid comparison of the quality of the interfaces using quickest sequential change detection and sequential two-sample hypotheses tests.

Published
2004-12-13
Publisher
IEEE
http://dx.doi.org/10.1109/QSHINE.2004.46
Copyright © 2004–2025 IEEE
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