A check digit system over a group of arbitrary order

Yanling Chen; Markku Niemenmaa; Han Vinck

8th International Conference on Communications and Networking in China

Research Article

A check digit system over a group of arbitrary order

Cite: BibTeX Plain Text

@INPROCEEDINGS{10.1109/ChinaCom.2013.6694722,
    author={Yanling Chen and Markku Niemenmaa and Han Vinck},
    title={A check digit system over a group of arbitrary order},
    proceedings={8th International Conference on Communications and Networking in China},
    publisher={IEEE},
    proceedings_a={CHINACOM},
    year={2013},
    month={11},
    keywords={abelian group check digit error detection},
    doi={10.1109/ChinaCom.2013.6694722}
}

Yanling Chen
Markku Niemenmaa
Han Vinck
Year: 2013
A check digit system over a group of arbitrary order
CHINACOM
IEEE
DOI: 10.1109/ChinaCom.2013.6694722

Yanling Chen¹^,*, Markku Niemenmaa², Han Vinck³

1: Ruhr University Bochum
2: University of Oulu
3: University of Duisburg-Essen

*Contact email: yanling.chen-q5g@rub.de

Abstract

In this paper, we study a check digit system over an abelian group of an arbitrary order. The work is a generalization of a recently introduced check digit system which is based on the use of elementary abelian p-group of order p^k. Furthermore, we challenge the current standards by comparing our system with several well-known and widely used systems such as ISBN, MEID, ISAN and the system over alphanumeric characters. We show that our design outperforms all of them in terms of the error detection capability.

Keywords: abelian group check digit error detection

Published: 2013-11-14
Publisher: IEEE

: http://dx.doi.org/10.1109/ChinaCom.2013.6694722