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Workshop on Stochasticity in Distributed Systems

Research Article

Stochasticity of probabilistic systems: analysis methodologies case-study

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  • @INPROCEEDINGS{10.1109/COLCOM.2005.1651267,
        author={Anwitaman Datta and Martin Hasler and Karl Aberer},
        title={Stochasticity of probabilistic systems: analysis methodologies case-study},
        proceedings={Workshop on Stochasticity in Distributed Systems},
        publisher={IEEE},
        proceedings_a={STODIS},
        year={2006},
        month={7},
        keywords={Algorithm design and analysis  Distributed computing  Distribution functions  Equations  Information analysis  Large-scale systems  Probability distribution  Steady-state  Stochastic processes  Stochastic systems},
        doi={10.1109/COLCOM.2005.1651267}
    }
    
  • Anwitaman Datta
    Martin Hasler
    Karl Aberer
    Year: 2006
    Stochasticity of probabilistic systems: analysis methodologies case-study
    STODIS
    ICST
    DOI: 10.1109/COLCOM.2005.1651267
Anwitaman Datta1,*, Martin Hasler1,*, Karl Aberer1,*
  • 1: Ecole Polytechnique Fédérale de Lausanne (EPFL), School of Computer and Communication Sciences, CH-1015 Lausanne, Switzerland
*Contact email: anwitaman.datta@epfl.ch, martin.hasler@epfl.ch, karl.aberer@epfl.ch

Abstract

We do a case study of two different analysis techniques for studying the stochastic behavior of a randomized system/algorithms: (i) The first approach can be broadly termed as a mean value analysis (MVA), where the evolution of the mean state is studied assuming that the system always actually resides in the mean state; (ii) The second approach looks at the probability distribution function of the system states at any time instance, thus studying the evolution of the (probability mass) distribution function (EoDF).

Keywords
Algorithm design and analysis Distributed computing Distribution functions Equations Information analysis Large-scale systems Probability distribution Steady-state Stochastic processes Stochastic systems
Published
2006-07-24
Publisher
IEEE
http://dx.doi.org/10.1109/COLCOM.2005.1651267
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