Research Article
Labelled OBS Test Bed for Contention Resolution Study
@INPROCEEDINGS{10.1109/BROADNETS.2008.4769048, author={Thomas Legrand and Hisao Nakajima and Paulette Gavignet and Bernard Cousin}, title={Labelled OBS Test Bed for Contention Resolution Study}, proceedings={5th International ICST Workshop on Optical Burst/Packet Switching}, publisher={IEEE}, proceedings_a={WOBS}, year={2010}, month={5}, keywords={contention resolution optical burst switching label semiconductor label extractor semiconductor optical amplifier gate hybrid wavelength converter}, doi={10.1109/BROADNETS.2008.4769048} }- Thomas Legrand
Hisao Nakajima
Paulette Gavignet
Bernard Cousin
Year: 2010
Labelled OBS Test Bed for Contention Resolution Study
WOBS
IEEE
DOI: 10.1109/BROADNETS.2008.4769048
Abstract
This paper reports a test bed aiming at studying burst contention resolution mechanisms in "Labelled" OBS networks together with a simulation tool that is designed to back up experiments. The test bed is composed of a Labelled OBS core node and a measurement arrangement for burst capture and analysis. Different components of the test bed are presented together with their measured characteristics. The simulation tool is presented with a preliminary simulation that compares the Labelled OBS scheme with the conventional BCP OBS scheme. The results show that the Labelled OBS scheme outperforms the conventional OBS scheme.
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