Research Article
On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise
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@INPROCEEDINGS{10.1007/978-3-642-11530-1_3, author={Chang-Tsun Li and Chih-Yuan Chang and Yue Li}, title={On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise}, proceedings={Information Security and Digital Forensics. First International Conference, ISDF 2009, London, United Kingdom, September 7-9, 2009, Revised Selected Papers}, proceedings_a={ISDF}, year={2012}, month={5}, keywords={Digital Device Identification Digital Forensics Digital Investigation Digital Evidence Sensor Pattern Noise Integrity Verification}, doi={10.1007/978-3-642-11530-1_3} }- Chang-Tsun Li
Chih-Yuan Chang
Yue Li
Year: 2012
On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise
ISDF
Springer
DOI: 10.1007/978-3-642-11530-1_3
Abstract
In this work we study the power of the methods for digital device identification and image integrity verification, which rely on sensor pattern noise as device signatures, and the repudiability of the conclusions drawn from the information produced by this type of methods. We prove that the sensor pattern noise existing in the original images can be destroyed so as to confuse the investigators. We also prove that sensor pattern noise of device A can be easily embedded in the images produced by another device B so that the device identifier would mistakenly suggest that the images were produced by device A, rather than by B, and mislead forensic investigations.
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