Designing Reliable Digital Molecular Electronic Circuits

Ci Lei; Dinesh Pamunuwa; Steven Bailey; Colin Lambert

Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings

Research Article

Designing Reliable Digital Molecular Electronic Circuits

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@INPROCEEDINGS{10.1007/978-3-642-04850-0_17,
    author={Ci Lei and Dinesh Pamunuwa and Steven Bailey and Colin Lambert},
    title={Designing Reliable Digital Molecular Electronic Circuits},
    proceedings={Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings},
    proceedings_a={NANO-NET},
    year={2012},
    month={5},
    keywords={molecular electronics circuit simulation nanotechnology},
    doi={10.1007/978-3-642-04850-0_17}
}

Ci Lei
Dinesh Pamunuwa
Steven Bailey
Colin Lambert
Year: 2012
Designing Reliable Digital Molecular Electronic Circuits
NANO-NET
Springer
DOI: 10.1007/978-3-642-04850-0_17

Ci Lei¹, Dinesh Pamunuwa¹, Steven Bailey¹, Colin Lambert¹

1: Lancaster University

Abstract

Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.

Keywords: molecular electronics circuit simulation nanotechnology

Published: 2012-05-28

: http://dx.doi.org/10.1007/978-3-642-04850-0_17