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Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings

Research Article

Designing Reliable Digital Molecular Electronic Circuits

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  • @INPROCEEDINGS{10.1007/978-3-642-04850-0_17,
        author={Ci Lei and Dinesh Pamunuwa and Steven Bailey and Colin Lambert},
        title={Designing Reliable Digital Molecular Electronic Circuits},
        proceedings={Nano-Net. 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings},
        proceedings_a={NANO-NET},
        year={2012},
        month={5},
        keywords={molecular electronics circuit simulation nanotechnology},
        doi={10.1007/978-3-642-04850-0_17}
    }
    
  • Ci Lei
    Dinesh Pamunuwa
    Steven Bailey
    Colin Lambert
    Year: 2012
    Designing Reliable Digital Molecular Electronic Circuits
    NANO-NET
    Springer
    DOI: 10.1007/978-3-642-04850-0_17
Ci Lei1, Dinesh Pamunuwa1, Steven Bailey1, Colin Lambert1
  • 1: Lancaster University

Abstract

Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.

Keywords
molecular electronics circuit simulation nanotechnology
Published
2012-05-28
http://dx.doi.org/10.1007/978-3-642-04850-0_17
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