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1st International ICST Conference on Nano-Networks

Research Article

Can Carbon Nanotubes Extend the Lifetime of On-Chip Electrical Interconnections?

Cite
BibTeX Plain Text
  • @INPROCEEDINGS{10.1109/NANONET.2006.346235,
        author={K. Banerjee and N.   Srivastava and S. Im},
        title={Can Carbon Nanotubes Extend the Lifetime of On-Chip Electrical Interconnections?},
        proceedings={1st International ICST Conference on Nano-Networks},
        publisher={IEEE},
        proceedings_a={NANO-NET},
        year={2007},
        month={4},
        keywords={},
        doi={10.1109/NANONET.2006.346235}
    }
    
  • K. Banerjee
    N. Srivastava
    S. Im
    Year: 2007
    Can Carbon Nanotubes Extend the Lifetime of On-Chip Electrical Interconnections?
    NANO-NET
    IEEE
    DOI: 10.1109/NANONET.2006.346235
K. Banerjee1, N. Srivastava1, S. Im1
  • 1: Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA

Abstract

Current earning capacity of copper interconnects is being severely limited due to their increasing resistivity with scaling and reliability constraints. Metallic carbon nanotubes (CNT) are promising candidates that can potentially address the challenges faced by copper and thereby extend the lifetime of on-chip electrical interconnects. This paper provides an overview of the state-of-the-art of CNT interconnect research and discusses both advantages and challenges of this emerging nanotechnology

Published
2007-04-16
Publisher
IEEE
http://dx.doi.org/10.1109/NANONET.2006.346235
Copyright © 2006–2026 IEEE
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