On-Chip Optical Interconnect for Reduced Delay Uncertainty

Guoqing Chen; Hui Chen; Mikhail Haurylau; Nicholas A. Nelson; David H. Albonesi; Philippe M. Fauchet; Eby G. Friedman

2nd Internationa ICST Conference on Nano-Networks

Research Article

On-Chip Optical Interconnect for Reduced Delay Uncertainty

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@INPROCEEDINGS{10.4108/ICST.NANONET2007.2005,
    author={Guoqing Chen and Hui Chen and Mikhail Haurylau and Nicholas A. Nelson and David H. Albonesi and Philippe M. Fauchet and Eby G. Friedman},
    title={On-Chip Optical Interconnect for Reduced Delay Uncertainty},
    proceedings={2nd Internationa ICST Conference on Nano-Networks},
    proceedings_a={NANO-NET},
    year={2010},
    month={5},
    keywords={},
    doi={10.4108/ICST.NANONET2007.2005}
}

Guoqing Chen
Hui Chen
Mikhail Haurylau
Nicholas A. Nelson
David H. Albonesi
Philippe M. Fauchet
Eby G. Friedman
Year: 2010
On-Chip Optical Interconnect for Reduced Delay Uncertainty
NANO-NET
ICST
DOI: 10.4108/ICST.NANONET2007.2005

Guoqing Chen¹, Hui Chen², Mikhail Haurylau¹, Nicholas A. Nelson¹, David H. Albonesi³, Philippe M. Fauchet¹, Eby G. Friedman¹

1: Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York, 14627
2: Department of Physics and Astronomy, University of Rochester, Rochester, New York, 14627
3: School of Electrical and Computer Engineering, Cornell University, Ithaca, New York, 14853

Abstract

Interconnect has become a primary bottleneck in the integrated circuit design process. As CMOS technology is scaled, the design requirements of delay, power, bandwidth, and noise due to the on-chip interconnects have become increasingly stringent. New design challenges are continuously emerging, such as delay uncertainty induced by process and environmental variations. It has become increasingly difficult for conventional copper interconnect to satisfy a variety of design requirements. On-chip optical interconnect has been considered as a potential partial substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-of-the-art optical technologies. Based on these predictions, the delay uncertainty in electrical and optical interconnects is analyzed, and shown to affect both the latency and bandwidth of the interconnect. The two interconnects are also compared for latency, power, and bandwidth density.

Published: 2010-05-16
Modified: 2011-09-11

: http://dx.doi.org/10.4108/ICST.NANONET2007.2005